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X-ray Laue systems

PSL delivers an X-ray Laue system that can orient crystals in real time down to less than 0.3 degree accuracy.

The instrument uses a back scattered geometry with a central hole, enabling the delivery of a bright collimated beam onto the sample through the camera.

It’s very high sensitivity allows one to record patterns, acquisition sequences in real time directly onto a networked PC which controls a 6 axis motorized goniostat.
It’s very good spatial resolution can resolve twin spots / structures. Thanks to careful PSL calibrated alignment routine and high precision design, Laue patterns of known structures can be oriented down to less than 0.3 degree with accuracy. The system can be combined with a front scattering detector used for scanning grain / structure in homogeneity of large samples with increased spatial resolution.

Low cost of ownership, limited maintenance, combined with a very intuitive Graphical User Interface makes the system extremely attractive for both academic as well as industrial customers.

X-ray Laue systems
X-ray Laue systems

Photonic Science Limited - X-ray Laue and Scientific Detector Systems